MK-328 TR\LCR\ESR Transistor LCR ESR Tester Cemiconductor Device Analyzer

MK-328 TRLCRESR Transistor LCR ESR Tester Cemiconductor Device Analyzer
Product Description
Use the latest M328 version software, more function than M8 version. The microcontroller adopts 8 MHz external crystals oscillator, better measurement accuracy. The related resistance of affecting the accuracy use 1%metal film resistor, and the rest also use 1% metal film resistor. Use backlight low-power consumption LCD screen, compared with the overall power consumption is almost negligible, convenient to read the data in the dark. Up to two Resistors are measured and shown values with up to four decimal digits in the right dimension. All symbols are surrounded by the probe numbers of the Tester. So Potentiometer can also be measured. If the Potentiometer is adjusted to one of its ends, the Tester cannot differ the middle pin and the end pin. Capacitors with value below 30pF are usually not be detected, but can be measured together with a parallel diode or a parallel capacitor with at least 30pF. In this case you must subtract the capacity value of the parallel connected part. Note: Before the measurement of capacitance, must to discharge the capacitor, otherwise may damage the instrument.Use the latest M328 version software, more function than M8 version. The microcontroller adopts 8 MHz external crystals oscillator, better measurement accuracy. The related resistance of affecting the accuracy use 1%metal film resistor, and the rest also use 1% metal film resistor.
Use backlight low-power consumption LCD screen, compared with the overall power consumption is almost negligible, convenient to read the data in the dark.
Up to two Resistors are measured and shown values with up to four decimal digits in the right dimension. All symbols are surrounded by the probe numbers of the Tester. So Potentiometer can also be measured. If the Potentiometer is adjusted to one of its ends, the Tester cannot differ the middle pin and the end pin.
Capacitors with value below 30pF are usually not be detected, but can be measured together with a parallel diode or a parallel capacitor with at least 30pF. In this case you must subtract the capacity value of the parallel connected part.
Note: Before the measurement of capacitance, must to discharge the capacitor, otherwise may damage the instrument.
A key operation with automatic shutdown.
Battery operation is possible since shutdown current is only about 20nA. Please note the battery is not included.
Automatic detection of NPN and PNP bipolar transistors, N- and P-Channel MOSFETs, JFETs, diodes, double diodes, unidirectional thyristor and bidirectional thyristor.
Automatic detection of pin layout of the detected part.
Measuring the current amplification coefficient of the bipolar transistor and the voltage of base - emitter threshold.
Darlington transistors can be Identify by the threshold voltage of the high current amplification factor.
Detection the bipolar transistor and the protection diode of MOS
Measuring the Gate threshold voltage and Gate capacity value of MOSFETs.
The resolution of the resistance measurement is 0.1Ohm, can measure up to 50MOhm
One capacitor can be detected and measured. It is shown value with up to four decimal digits in the right dimension. The value can be from 30pF to 100mF. The resolution can be up to 1 pF
Up to two diodes are shown in correct order and by diode symbol. Additionally the forward voltages are shown.
LED is detected as diode; the forward voltage is much higher than normal. Two-in-one LEDs are also detected as two diodes.
Testing time is about two seconds, only capacity or inductance measurement can cause longer period.