Solar cell type single chip solar module defect el tester

Solar Cell Type Single Chip Solar Module Defect EL Tester
Product Show
MJ-MG160 Off-line Camera Obscura Defect EL Tester
SpecificationsModeApply to mono-crystalline silicon / Polysilicon module testerTest Method
Manual off-lineCamera Pixel
4392*3264(1600W pixel) 1400W optional; 830W pixel etc.Monitory PointBefore lamination/ after laminationTest Size
125mm*125mm, 156mm*156mm.Power Supply220V/50HZMachine Size
460mm*360mm*680mm(L*W*H)Operation Mode
1. Automatic or manual transform;
2. Screen touching operation;
3. HMI show the running state of equipment and warmingUPS60V/10ATest PeriodExposure time 0-25s
Equipment Performance
Overview Equipment Performance:
The sloar module defect EL tester is specially used in the filtration of solar energy mono-crystalline silicon and the poly-crystalline silicon solar panels.Thruogh stimulation of the solar spectrum lamp-house, carries on the testing and surverys to the module related electrical parameter. According to the measurement result tests the panel.
Equipment Features
1. Unique technology can ensure equipment stability and efficiency.
2. Speed of tester is faster.
3. Working for 24 hours wityout interruption.
4. Reasonable structure, convenient installation and maintenance.
5. Humanized design of control panel, exerting the hightest efficiency.
6. Professional customization, pretty HMI, simply operation.